The capacitance–voltage (C–V) characteristics of ultrathin polyimide (PI) Langmuir–Blodgett (LB) films were examined with taking into account the interfacial electrostatic phenomena and the presence of the interfacial electric states at the metal/PI LB film interface. It was revealed that the apparent film thickness of metal/PI LB film/metal elements decreases due to the charge exchange at the metal/film interface. It was also shown that the current–voltage (I–V) characteristics of Au/PI LB film/Al elements were ruled by the electric field of an order of 108–109 V/m built at the metal/film interface due to the excess charges transferred from metals into PI LB films.
Eiji Itoh, Mitsumasa Iwamoto
Journal of Applied Physics