This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

Applied Physics Letters

We present depth resolved X-ray micro-Laue diffraction experiments on the low temperature domain structure of SrTiO3. At 80 K, monochromatic X-ray diffraction shows an elongated out-of-plane unit cell axis within a matrix of in-plane oriented tetragonal unit cells. Full deviatoric strain mappings from white beam diffraction show a dominance of two tetragonal domain orientations (x- and z-axes) over a large area of sample surface. This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

This information sets an upper bound on domain wall widths and offers a method for studying 3D domain structure at low temperatures.

Depth resolved domain mapping in tetragonal SrTiO3 by micro-Laue diffraction