Fulvio Corno, M. Reorda, Giovanni Squillero
Mar 11, 2002
Journal name not available for this finding
The cost for testing integrated circuits represents a growing percentage of the total cost for their production. The former strictly depends on the length of the test session, and its reduction has been the target of many efforts in the past. This paper proposes a new method for reducing the test length by adopting a new architecture and exploiting an evolutionary optimization algorithm. A prototype of the proposed approach was tested on ISCAS standard benchmarks and the experimental results show its effectiveness.