Characterization of an x-ray diamond phase plate by a polarization analyzer using multiple diffraction
K. Hirano, Y. Ito, Y. Shinohara
Mar 22, 2013
Citations
0
Citations
Journal
Journal of Physics: Conference Series
Full text
Semantic Scholar
Key Takeaway Key Takeaway: This study successfully obtained elliptically polarized x-rays and determined the Stokes parameters using a combination of linear and multiple diffraction analyzers at the Photon Factory.
Abstract
X-ray transmission phase plates are widely used to control the x-ray polarization at many synchrotron facilities. Although their performance can be calculated from the dynamical theory of x-ray diffraction, it is sometimes necessary to measure the produced polarization for a precise analysis of experimental data. To meet this requirement, we have combined two types of x-ray analyzers: a linear analyzer based on 45° Bragg diffraction and an analyzer based on multiple diffraction. The former was used to adjust a diamond phase plate and the latter for a complete determination of the produced polarization. We successfully obtained elliptically polarized x-rays and determined the Stokes parameters at the vertical-wiggler beamline BL-14B of the Photon Factory. The obtained degree of circular polarization was −0.70 and 0.95.