M. S. Sarto, A. Tamburrano
Apr 12, 2010
2010 Asia-Pacific International Symposium on Electromagnetic Compatibility
The current approach to multi-scale modelling and simulation of advanced materials for EMC applications are discussed and presented. The critical issues related to the integration of modelling methods at different scales are addressed. Examples are given that illustrate the suggested approaches to predict the behavior and to influence the design of nanostructured materials for next generation nano-interconnects and frequency selective surfaces.