Annick Loiseau, G. Tendeloo, P. Bernier
1993
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Abstract
Complementary to neutron and X ray diffraction, electron microscopy (TEM) is a very powerful technique for characterizing crystalline materials at microscopic and atomic scales. This technique has been rapidly used to study C60 and C70 solids [1, 2] and has allowed in particular to identify various lattice defects present in these materials and to determine different phase transitions through in situ experiments [1-5].