W. Paik
1993
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Abstract
Ellipsometry is an experimental technique measuring changes in polarization (elliptical polarization in general) of light to obtain information on materials, especially those in the phase boundary regions. In the usual mode of ellipsometry operation, a beam of polarized light is reflected at a non-normal angle from a flat surface, which may be covered with a thin film, and the resulting change in the polarization of light is measured. This technique is useful for investigating thin films as well as bulk materials. Ellipsometry has been applied to studies of a wide range of electrochemical systems for the past three decades, such as in studies of films on metals formed by passivation or otherwise, in measurements of adsorption of ionic and molecular species, in electrodeposition studies, and in investigations of conducting polymers.