A. Shard, S. Spencer, Steve Smith
Feb 1, 2015
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Influential Citations
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Journal
International Journal of Mass Spectrometry
Abstract
Abstract Well defined reference materials consisting of Irganox 1010 and either Irganox 1098 or Fmoc-pentafluoro- l -phenylalanine (Fmoc-PFLPA) are described. These have been analysed with time-of-flight secondary ion mass spectrometry (ToF-SIMS) using argon gas cluster ions, 5 keV A r 2000 + , as a sputtering source and 25 keV B i 3 + ions as a primary source for analysis. We demonstrate that the binary mixtures of Irganox 1010 and Irganox 1098 demonstrate some weak matrix effects whereas the mixtures of Irganox 1010 and Fmoc-PFLPA demonstrate some strong and unusual matrix effects. A parameter, Ξ, is introduced to describe the magnitude of the matrix effect in organic SIMS and a method to correct for the different apparent depths of origin of secondary ions in a depth profile. With some knowledge of the matrix effect magnitude and sign provided by Ξ it becomes possible to select secondary ions for reliable quantitative analysis in binary mixtures. We also indicate how the differences in Ξ between different secondary ions may, in the future, be exploited to assess compositional variation or nanoscale phase separation in materials.