H. Mo, S. Kewalramani, G. Evmenenko
Jul 24, 2007
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0
Influential Citations
5
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Journal
Physical Review B
Abstract
The temperature dependence of the density oscillations (layers) at the free surface of tetrakis(2-ethylhexoxy)silane, a nonmetallic molecular liquid, was investigated using x-ray reflectivity. Below {approx}215K , the layer parameters weakly vary with temperature, if at all. Above this temperature, the layer spacings and intrinsic layer widths increase continuously, until there is no identifiable layering above 230K . This transition occurs at T/{Tc}{approx}0.23 , a temperature region that is usually accessible in metallic liquids but is preempted by freezing in many dielectric liquids.